Item Display - High resolution focused ion beams : FIB and its applications : the physics of liquid metal ion sources and ion optics and their application to focused ion beam technology

Skip navigation
BYU
Harold B. Lee Library

Navigation Menu

Contextual Navigation Menu

record 1 of 1 for search words or phrase "9780306473500{020,022}"

Change Display

Item Details

  • Place Hold
  • Find more by this author
  • Find more on these topics
  • Nearby items on shelf
  • Bibliographic Record
  • A Look Inside
  • Bibligraphic Information

    Title
    High resolution focused ion beams : FIB and its applications : the physics of liquid metal ion sources and ion optics and their application to focused ion beam technology
    Author
    Orloff, Jon.

    Bibliographic Information

    MARC Record

    Full View From Catalog
    Personal Author:
    Orloff, Jon.
    Title:
    High resolution focused ion beams : FIB and its applications : the physics of liquid metal ion sources and ion optics and their application to focused ion beam technology / Jon Orloff, Mark Utlaut, and Lynwood Swanson.
    Publication info:
    New York : Kluwer Academic/Plenum Publishers, ©2003.
    Physical description:
    x, 303 p. : ill. ; 26 cm.
    Content type:
    text
    Medium:
    unmediated
    Format:
    volume
    Bibliography note:
    Includes bibliographical references and index.
    Subject term:
    Ion bombardment--Industrial applications.
    Added author:
    Swanson, Lynwood, 1934-
    Added author:
    Utlaut, Mark William, 1949-
    LCCN:
    2002028661
    ISBN:
    030647350X

    • Holdings

      HBLL
        Copy Material Location
      QC 702.7 .B65 O75 2003 1 Book Harold B. Lee Library Bookshelves
    • Send to RefWorks
    • All content

Contextual Navigation Menu